CSIC adds new electron microscope for advanced materials analysis
Published
The Spanish National Research Council (CSIC) has added a new field emission scanning electron microscope (FE-SEM) to the Institute of Materials Science of Madrid (ICMM-CSIC). With this equipment, researchers will be able to observe samples with very high precision and analyse the structure of materials at a very small scale.
The new microscope is part of efforts to improve the research capacity of the centre. The purchase was funded with European money from the NextGenerationEU programme, a European Union plan created to help economic recovery after the COVID-19 pandemic.
This type of instrument is very useful in fields such as chemistry, physics and materials science. Thanks to it, scientists can study new materials used in technology, energy or medicine. CSIC is Spain's largest public research body and, with this advance, it strengthens its tools for scientific research.
According to the information published, the addition of the microscope expands the work possibilities of the institute's research groups. In this way, the centre will be able to carry out more complex projects in the coming years.
Sources: La Voz de Madrid
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